EIA 364-87-B-2017 PDF Download

The EIA 364-87-B-2017 standard aims to provide a set of methods for detecting very short duration events, as brief as 1 nanosecond. The standard focuses on identifying specimen failure events caused by sudden large resistance fluctuations or voltage variations that may lead to improper triggering of high-speed digital circuits.

The need for nanosecond event detection arises from the susceptibility of certain applications to noise. However, it should be noted that this technique does not measure the duration of an event, but rather focuses on detecting its occurrence. It is important to emphasize that low nanosecond event detection cannot be used as a substitute for the standard requirement of 1.0 microsecond minimum duration. The nanosecond test was specifically developed to identify different failure mechanisms compared to the 1.0 microsecond test. The number of contacts being monitored in a series circuit will impact the time events that can be detected for a specified event.

In this standard, an event is defined as a voltage increase of a certain magnitude that lasts longer than a specified time duration. This definition provides clarity on what qualifies as an event in the context of nanosecond event detection testing.